G - Physics – 02 – B
Patent
G - Physics
02
B
88/98
G02B 27/14 (2006.01) G02B 17/00 (2006.01)
Patent
CA 1094852
ABSTRACT OF THE DISCLOSURE The invention relates to a contour inspection apparatus of the type which has an imaging element for projecting the image of a light pattern on the article to be inspected. In accordance with the invention, the apparatus includes a first forming mirror and a second forming mirror which bracket the light pattern on the article to be inspected. A beam splitter is optically aligned with the first and second mirrors to form a composite optical path comprising a first segment reflected from the first forming mirror and a second segment reflected from the second forming mirror. The invention also relates to a method for viewing the cross section contour of an article using the above apparatus and including the steps of projecting a light pattern onto the article at the cross section to be inspected. The light pattern is viewed along the composite optical path, and an image is formed of the light pattern as viewed along the composite optical path.
299307
Swabey Ogilvy Renault
United Technologies Corporation
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