H - Electricity – 01 – L
Patent
H - Electricity
01
L
356/177, 345/22
H01L 21/22 (2006.01) H01L 21/3065 (2006.01) H01L 31/0236 (2006.01)
Patent
CA 1141456
Abstract A differential reactive ion etching process sig- nificantly reduces the reflectivity of silicon. The process takes place in a reactive ion etching tool, typically a diode-configured system employing ambient gases which react with the silicon.
341843
Hansen Thomas A.
Johnson Claude Jr.
Wilbarg Robert R.
International Business Machines Corporation
Saunders Raymond H.
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