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Frederique de Fornel

G - Physics – 01 – Q

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Country: France

Discriminating spectroscopy of the optical profile of a...

G - Physics – 01 – Q
Patent

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Method for localized spectroscopid analysis of the light...

G - Physics – 01 – N
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Method of optical near field microlithography and...

H - Electricity – 01 – L
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Microscopy method and reflexion near field microscope

G - Physics – 01 – Q
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Discriminating spectroscopy of the optical profile of a...

G - Physics – 01 – Q
Patent

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Profile ID: LFCA-PAI-P-1355349

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