4. G - Physics
  5. 01
  6. B

James P. Hubner

G - Physics – 01 – B

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Country: United States Of America

Essentially thickness independent single layer photoelastic...

G - Physics – 01 – B
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Method and apparatus for measuring strain using a...

G - Physics – 01 – B
Patent

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Essentially thickness independent single layer photoelastic...

G - Physics – 01 – B
Patent

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Profile ID: LFCA-PAI-P-1649782

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