4. B - Operations, Transporting
  5. 21
  6. B

Tsuneo Suyama

B - Operations – Transporting – 21 – B

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Inventor

Country: Japan

Defect marking method and device

B - Operations – Transporting – 21 – B
Patent

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Method for marking defect and device therefor

G - Physics – 01 – N
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Profile ID: LFCA-PAI-P-1330158

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