Analysis of the physical properties of thin layers and...

Details Analysis of the physical properties of thin layers and... Analysis of the physical properties of thin layers and...

G - Physics

01

N

G01N 21/84 (2006.01) G01N 21/55 (2006.01) G02F 1/19 (2006.01)

Patent

CA 2093625

O.Z. 0050/43148 Abstract of the Disclosure: A method of analysing the physical properties of thin electro-optically active substances uses polarized light, with which the layer to be analysed is irradiated, and the reflected light or transmitted light is diverted onto an imaging system, polarized light being used on the layer to be analysed in order to excite waveguide modes which, with the aid of an applied modulated electrical field, can likewise be modulated in the case of an electro-optically active layer.

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