G - Physics
01
N
Inventor
Country: Germany
Analysis of the physical properties of thin layers and...
Assembly and apparatus for extracellular...
Determination of refractive index and thickness of thin layers
Examination of physical properties of thin films
Examination of surface structures
Analysis of the physical properties of thin layers and...
Determination of refractive index and thickness of thin layers
Examination of physical properties of thin films
Optical filtering of polarized light
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