G - Physics – 01 – M
Patent
G - Physics
01
M
73/165
G01M 17/02 (2006.01)
Patent
CA 1322673
APPARATUS AND METHODS FOR IMPROVING UNIFORMITY MEASUREMENTS Abstract of the Disclosure Apparatus and methods for use in measuring the uniformity of a body such as a tire, wheel or the like wherein a waveform related to the uniformity of the body is digitally sampled to acquire a series of data samples, each of which is correlated with a respective physical location on the body. According to a first aspect of the invention, a non-repetitive error component of the waveform is corrected for by sampling the same location on the body at two differ- ent times and determining the difference between the corresponding data samples. A part of the total difference is allocated to each of the data samples in the series according to a predetermined mathematical function which at least approximately describes the non-repetitive component of the waveform. The part of the difference allocated to each sample is then subtracted from it to obtain a corrected series of data sample. According to a second aspect of the invention, the maximum, minimum and/or peak-to-peak values of the waveform are more accurately determined by relating selected extreme data samples and one or more data samples adjacent thereto to a polynomial function of at least second order. The function is then evaluated at the location where its first deriva- tive equals zero to determine a more accurate and repeatable approximation of a maximum, minimum or peak-to-peak value of the waveform. According to yet another aspect of the present invention the first and second aspects above are practiced in conjunction with one another.
566983
Illinois Tool Works Inc.
Macrae & Co.
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