Apparatus for, and method of, measuring time delay

Details Apparatus for, and method of, measuring time delay Apparatus for, and method of, measuring time delay

G - Physics

01

R

354/138, 354/46

G01R 23/16 (2006.01) G06F 15/332 (1985.01)

Patent

CA 1245362

INVENTOR: LAI-WAN M. SZETO TITLE: APPARATUS FOR, AND METHOD OF, MEASURING TIME DELAY ABSTRACT OF THE DISCLOSURE An apparatus for, and method of, analysing a signal takes the Fourier Transform of both a first signal and a shifted signal, which has previously been subjected to a shift, for example a time-shift, relative to the first signal. This gives sets of first and second frequency components corresponding respectively to the first signal and the shifted signal. The arguments of at least one pair of corresponding first and second frequency components are calculated, and subtracted to give a phase difference. From this phase difference, the time-shift or time delay of the corresponding constituent of the first signal can be determined.

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