Apparatus for determining the thickness of an optical sample

Details Apparatus for determining the thickness of an optical sample Apparatus for determining the thickness of an optical sample

G - Physics

01

B

G01B 9/04 (2006.01) G01B 11/06 (2006.01) G01J 3/02 (2006.01) G01N 21/01 (2006.01)

Patent

CA 2244425

The present invention relates to the field of quantitative microspectroscopy, and in particular to an apparatus for determining the exact thickness of an optical microscopic sample.

La présente invention concerne le domaine de la microspectroscopie quantitative et a trait, en particulier, à un appareil pour déterminer l'épaisseur exacte d'un échantillon au microscope optique.

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