G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 23/20 (2006.01) G01N 35/00 (2006.01)
Patent
CA 2376073
Method and apparatus for mounting a sample comprising a crystal for X-ray crystallographic analysis, a method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device, and a method for determining the structure of a sample containing a crystal by means of X-ray crystallography.
La présente invention concerne un appareil destiné à supporter un échantillon et une technique qui comprend une analyse cristallographique aux rayons X, une technique d'alignement d'un échantillon contenant un cristal destiné à l'analyse cristallographique aux rayons X, cet échantillon étant supporté par un dispositif de positionnement, et une technique permettant de déterminer par cristallographie aux rayons X la structure d'un échantillon contenant un cristal.
Greer Jonathan
Jones Ronald B.
Muchmore Steven W.
Nienaber Vicki L.
Olson Jeffrey A.
Abbott Laboratories
Torys Llp
LandOfFree
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