G - Physics – 02 – B
Patent
G - Physics
02
B
G02B 6/124 (2006.01) G02B 5/18 (2006.01) G02B 6/02 (2006.01)
Patent
CA 2436499
A novel method and apparatus for varying the index of refraction of a material using an interference pattern is disclosed. The method and apparatus incorporate an ultra short duration pulse laser source. Electromagnetic radiation provided from the laser propagates to a diffractive element positioned in close proximity to the target material. The diffracted electromagnetic radiation forms an interference pattern, the peaks of which are sufficiently intense to cause a change in index of refraction.
Dai Xiaoli
Ding Huimin
Grobnic Dan
Henderson George
Lu Ping
Freedman & Associates
Her Majesty In Right Of Canada As Represented By The Minister Of
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