Electrooptic measurement systems for frequential analysis of...

G - Physics – 01 – R

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324/37

G01R 23/16 (2006.01) G01R 23/17 (2006.01) G02F 2/00 (2006.01)

Patent

CA 1320250

ABSTRACT OF THE DISCLOSURE An electrooptic measurement system embodying the invention comprises a continuously transmitting laser source with small line width, an electrooptic modulator and a spectroscopic device. The electrooptic modulator supplies a light wave which is linearly modulated in amplitude by an electrical signal. This modulated light wave has a frequency spectrum comprised of a central line width corresponding to the central wave frequency of the light wave and of two sidebands each representing the frequency spectrum of the electrical signal. The spectrocopic device is e.g. comprised of a sweeping interferometer, an optical detector and an oscilloscope. It receives the modulated light wave and supplies a display of the frequency spectrum of the electrical signal. The measurement system has a pass range of the order of 8,000 GHz and is suited to the characterization of electronic components and hyperfrequency microcircuits by means of contactless in situ measurements.

605846

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Electrooptic measurement systems for frequential analysis of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrooptic measurement systems for frequential analysis of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrooptic measurement systems for frequential analysis of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1336326

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.