Examination of the physical properties of thin films

Details Examination of the physical properties of thin films Examination of the physical properties of thin films

G - Physics

01

N

73/54

G01N 21/84 (2006.01) G01N 21/55 (2006.01) G01N 21/21 (2006.01)

Patent

CA 2015920

- 10 - O.Z. 0050/40790 Abstract of the Disclosure: The physical properties of thin films can be examined with the aid of polarized light with which the film to be examined is irradiated while the reflected or transmitted light is deflected in the direction of an imaging system, the polarized light having the effect of exciting waveguide modes in the film to be examined.

Affiliated with

Also associated with

Rating

Examination of the physical properties of thin films does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Examination of the physical properties of thin films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Examination of the physical properties of thin films will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1785427