Hall effect device test circuit

G - Physics – 01 – R

Patent

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324/48

G01R 31/26 (2006.01) G01R 15/20 (2006.01) H01L 21/66 (2006.01)

Patent

CA 1193663

HALL EFFECT DEVICE TEST CIRCUIT ABSTRACT OF THE DISCLOSURE A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, a voltage switching circuit, a comparison circuit, a retriggerable mono- stable multivibrator circuit and a visual indicator circuit are included. The comparison circuit compares the Hall effect device switching voltage to a pre- determined threshold and controls the multivibrator circuit which causes a visual pass/fail signal to be provided.

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