High density v-mos memory array

H - Electricity – 01 – L

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

352/48

H01L 21/308 (2006.01) G11C 11/34 (2006.01) H01L 21/306 (2006.01) H01L 21/768 (2006.01) H01L 21/8242 (2006.01) H01L 27/108 (2006.01)

Patent

CA 1169557

ABSTRACT HIGH DENSITY V-MOS MEMORY ARRAY A method for providing high density dynamic memory cells which provides self-alignment of both V-MOSFET device elements and their interconnections through the use of a device-defining masking layer having a plurality of parallel thick and thin regions. Holes are etched in portions of the thin region with the use of an etch mask defining a plurality of parallel regions aligned perpendicular to the regions in the masking layer. V-MOSFET devices having self- aligned gate electrodes are formed in the holes and device interconnecting lines are formed under the remaining portions of the thin regions. A com- bination of anisotropic etching and directionally dependent etching, such as reaction ion etching, may be used to extend the depth of V-grooves. A method of eliminating the overhang of a masking layer after anisotropic etching includes the oxidation of the V-groove followed by etching to remove both the grown oxide and the overhang is also disclosed. BU-9-78-014

378812

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

High density v-mos memory array does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High density v-mos memory array, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High density v-mos memory array will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1205027

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.