H - Electricity – 01 – L
Patent
H - Electricity
01
L
H01L 21/31 (2006.01) H01L 23/532 (2006.01)
Patent
CA 2258731
To provide an insulating film having a low dielectric constant and performance sufficient as an interlayer insulating film of a semiconductor device, and a semiconductor device using the insulating film. An insulating film for a semiconductor device used as an interlayer insulating film of a semiconductor device, the insulating film consisting essentially of poly-.alpha.,.alpha.-difluoroparaxylylene and having a relative dielectric constant of from 2.1 to 2.7. An insulating film for a semiconductor device used as an interlayer insulating film of a semiconductor device, the insulating film consisting essentially of poly-.alpha.,.alpha.-difluoroparaxylylene and exhibiting a step coverage of from 0.4 to 0.9. An insulating film for a semiconductor device capable of being filled in a gap, the insulating film consisting essentially of poly-.alpha.,.alpha.-difluoroparaxylylene, having a ratio (D/L) of a depth (D) and an opening width (L) of 1 or more.
Kimoto Hisao
Mochizuki Tsutomu
Daisankasei Co. Ltd.
Kishimoto Sangyo Co. Ltd.
Marks & Clerk
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