Interferometric methods and systems

Details Interferometric methods and systems Interferometric methods and systems

G - Physics

01

S

G01S 5/00 (2006.01) G01B 9/02 (2006.01) G01S 1/00 (2006.01)

Patent

CA 2732159

An interferometer estimates at least one interferometric parameter of one or more signals emitted from a source. The interferometer has an array of antennas and at least one phase detector configured to determine a plurality of phase measurements of the one or more source signals. A combined estimator processes the plurality of phase measurements to provide estimates of at least one sought parameter, representing the at least one interferometric parameter, and at least one noise parameter associated with the plurality of phase measurements. A postprocessor processes estimates of the at least one sought parameter based on at least one noise parameter received from the combined estimator to improve an estimate of the at least one interferometric parameter. The combined estimator is configurable to produce a maximum likelihood estimate of the at least one sought parameter using at least one noise parameter calculated based on the plurality of phase measurements.

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