G - Physics – 01 – J
Patent
G - Physics
01
J
G01J 3/457 (2006.01) G01J 9/02 (2006.01) G01J 3/26 (2006.01)
Patent
CA 2043582
ABSTRACT A measured laser oscillation light is introduced into an etalon, a concentric circular interference stripe derived from the etalon is irradiated on one dimensional photodetector array, and a diameter of said interference stripe is measured to measure a wavelength. By an arrangement wherein the reference laser oscillation light and the measured laser oscillation light are introduced into the etalon as described above, extremely high accurate wavelength measurement can be made without being affected by a positional deviation of an optical system and precision.
Oeda Yasuo
Ohmata Ken
Shibata Hideaki
Terada Mitsugu
Terashi Yuichiro
Mitsui Petrochemical Industries Ltd.
Oeda Yasuo
Ohmata Ken
Shibata Hideaki
Smart & Biggar
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