G - Physics – 01 – L
Patent
G - Physics
01
L
G01L 1/20 (2006.01) G01N 3/06 (2006.01) G01N 3/00 (2006.01)
Patent
CA 2084277
ABSTRACT OF THE DISCLOSURE A device for the determination of residual stress in a material sample consisting of a sensor coil, adjacent the material sample, whose resistance varies according to the amount of stress within the material sample, a mechanical push-pull machine for imparting a gradually increasing compressional and tensional force on the material sample, and an impedance gain/phase analyzer and PC for sending an input signal to and receiving an input signal from the sensor coil. The PC will measure and record the change in resistance of the sensor coil and the corresponding amount of strain of the sample. The PC will then determine from the measurements of change of resistance and corresponding strain of the sample the point at which the resistance of the sensor coil is at a minimum and the corresponding value and type of strain of the sample at that minimum resistance point thereby enabling a calculation of the residual stress in the sample.
Chern Engmin J.
Flom Yury
Chern Engmin J.
Flom Yury
Sim & Mcburney
The United States Government As Represented By The National Aero
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