G - Physics – 01 – G
Patent
G - Physics
01
G
G01G 17/02 (2006.01) G01N 23/16 (2006.01)
Patent
CA 2059640
2059640 9102951 PCTABS00003 A method and apparatus are disclosed wherein a plurality of basis weight sensors (120, 122, 124, 126, 128) are interleaved with one or more processing stations (104, 106, 108) used to conjoin or apply one or more layers (112, 116) to a base substrate (102) to form a multilayer product (118, 110) such that a sensor (120, 122, 124, 126, 128) is located on the input and output sides of each processing station (104, 106, 108). Each of the sensors (120, 122, 124, 126, 128) can be calibrated with a plurality of product calibrations such that multiple output signals corresponding to multiple products can be generated simultaneously by the sensors. Each of the sensors (120, 122, 124, 126, 128) is calibrated with product calibrations corresponding to the product (118, 110) or intermediate stage (114) of the product (118) which it monitors, the layer applied by the processing station preceding it, if any, and the layer applied by the processing station succeeding it, if any. Signals generated by the sensors (120, 122, 124, 126, 128) may then be used directly to determine the basis weight of the resulting product (118) and/or each intermediate stage (114) of the product, or the signals may be processed to determine the basis weight of each layer of material of the resulting product independent of the substrate (102) to which the layer was applied. Substrate independent layer measurement is performed by subtracting the output signal generated by the sensor preceding the processing station applying the layer based on the product calibration corresponding to the layer from the output signal generated by the sensor succeeding the processing station applying the layer based on the product calibration corresponding to the layer.
Abb Process Automation Inc.
Dukes John R.
Smart & Biggar
LandOfFree
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