Method and means for diagnostic testing of ccd memories

Details Method and means for diagnostic testing of ccd memories Method and means for diagnostic testing of ccd memories

G - Physics

11

C

328/177, 352/82.

G11C 29/00 (2006.01) G11C 29/48 (2006.01) G11C 29/50 (2006.01)

Patent

CA 1185698

METHOD AND MEANS FOR DIAGNOSTIC TESTING OF CCD MEMORIES Abstract of the Disclosure Diagnostic testing of a charge coupled device is facilitated by interconnecting the reference node of the sense amplifier for each data block in the CCD device with a probe contact on the device, thereby eliminating the need for applying a micro- probe to the sensitive reference node. Reference voltages under different operating conditions can be evaluated by measuring the device generated reference voltage or by apply- ing variable reference voltages through the probe contact to the reference node.

396541

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