4. H - Electricity
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Ramesh C. Varshney

H - Electricity – 01 – L

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Country: United States Of America

Identification of repaired integrated circuits

H - Electricity – 01 – L
Patent

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Method and means for diagnostic testing of ccd memories

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Programmable address buffer for partial products

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Wafer level integration technique

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Wafer level integration technique

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Profile ID: LFCA-PAI-P-1104680

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