Method and system for trend detection and analysis

Details Method and system for trend detection and analysis Method and system for trend detection and analysis

G - Physics

06

F

G06F 17/00 (2006.01) G06F 17/10 (2006.01)

Patent

CA 2417074

A method for comparing a data set to a baseline value comprising: providing the data set to be analyzed; locating potentially bad data points in at least a portion of the data set using an odd-man out recursive technique; preparing a baseline set by discarding the potentially bad data points from the at least a portion of the data set; and calculating a baseline value from the baseline set. A method for smoothing a data set comprising: providing the data set to be analyzed; determining a baseline value from at least a portion of the data set; smoothing the data set to diminish an effect of extraneous data points and obtain smoothed data, wherein the smoothing includes using a low-point weighted average and regression technique. A method for removing very low frequency noise from a time-based data set comprising: providing the time-based data set to be analyzed; determining a baseline value from at least a portion of the data set; smoothing the data set to diminish an effect of extraneous data points and obtain smoothed data, wherein the smoothing includes using a Fast Fourier Transform (FFT) algorithm to transfer the time-based data set into a frequency based data set; attenuating low frequencies of the frequency-based data set; and using an inverse Fourier Transform algorithm to transfer the attenuated frequency based data set into an attenuated time-based data set. Combinations of these methods are also disclosed. Systems to carry out these methods are also disclosed.

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