G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 31/28 (2006.01) G01R 31/26 (2006.01) G01R 31/303 (2006.01) G01R 31/317 (2006.01) G01R 31/3183 (2006.01)
Patent
CA 2321346
A software and hardware system and an associated methodology provides ATE-independent go/no-go testing as well as advanced failure diagnosis of integrated circuits for silicon debug, process characterization, production (volume) testing, and system diagnosis comprises an embedded test architecture designed within an integrated circuit; means for seamlessly transferring information between the integrated circuit and its external environment; and an external environment that effectuates the seamless transfer for the user to perform relevant test and diagnosis.
Bell Martin J.
Danialy Givargis A.
Howells Michael C.
Mc Donald Charles
Pateras Stephen V.
Logicvision Inc.
Proulx Eugene E.
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