Nitride-based transistors with a protective layer and a...

H - Electricity – 01 – L

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H01L 29/778 (2006.01) H01L 21/335 (2006.01)

Patent

CA 2553669

Transistors are fabricated by forming a nitride-based semiconductor barrier layer on a nitride-based semiconductor channel layer and forming a protective layer on a gate region of the nitride-based semiconductor barrier layer. Patterned ohmic contact metal regions are formed on the barrier layer and annealed to provide first and second ohmic contacts. The annealing is carried out with the protective layer on the gate region. A gate contact is also formed on the gate region of the barrier layer. Transistors having protective layer in the gate region are also provided as are transistors having a barrier layer with a sheet resistance substantially the same as an as-grown sheet resistance of the barrier layer.

Pour fabriquer des transistors, on forme une couche barrière à semi-conducteurs à base de nitrure sur une couche de canal à semi-conducteurs à base de nitrure et on forme une couche protectrice sur une région de grille de la couche barrière précitée. On forme également des régions métalliques configurées à contact ohmique sur la couche barrière et on les recuit pour former des premier et second contacts ohmiques. Le recuit est effectué avec la couche protectrice sur la région de grille. On forme également un contact de grille sur la région de grille de la couche barrière. Les transistors présentant une couche barrière dans la région de grille sont des transistors dont la couche barrière présente une résistance de couche sensiblement identique à la résistance de couche de croissance de la couche barrière.

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