Precision three dimensional profiling and measurement system...

Details Precision three dimensional profiling and measurement system... Precision three dimensional profiling and measurement system...

G - Physics

01

B

G01B 11/24 (2006.01) G01B 5/06 (2006.01)

Patent

CA 2078301

PRECISION THREE DIMENSIONAL PROFILING AND MEASUREMENT SYSTEM FOR CYLINDRICAL CONTAINERS ABSTRACT A system for generating a solid model of the sidewall of the container. A mandrel selectively holds the container in first and second locations. In the first location, a non-contact measurement apparatus utilizing a digital camera produces digital information for generating a three dimensional sidewall surface profile of the container based upon shadow edge detection. In the second position, a contact measurement apparatus produces information for generating a three dimensional sidewall thickness map of the container. A computer collects the information from the contact and non-contact measurement apparatuses and produces an overall solid model of the sidewall of the container based upon sidewall surface profile and sidewall thickness. The computer generates can tilt, diameter, can ovality, and can squarity information.

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