Small particle analysis of laser induced incandescence

Details Small particle analysis of laser induced incandescence Small particle analysis of laser induced incandescence

G - Physics

01

N

G01N 15/00 (2006.01) G01N 21/63 (2006.01) G01N 21/71 (2006.01)

Patent

CA 2380735

The laser-induced incandescence (LII) to analyze characteristics of submicron sized particles is described. LII is recognized as a good tool for determining the characteristics of small particles in a gas, e.g., volume fraction, particle size, and specific surface area. It uses the fact that transient cooling is dependent on the specific surface area of the particle, which is related to diameter of the particle. In LII, particles are heated by a pulsed laser light beam to a temperature where incandescence from the particles can be distinguished from ambient light. The surface temperature of particles and their volume fraction governs the incandescence. The temperature decay is proportional to the primary particle size. The invention uses an optical arrangement that ensures a near-uniform laser energy distribution spatial profile. The invention also uses a low fluence laser beam pulse to avoid evaporation of particles. Without significant evaporation and with a uniform energy profile, accurate and precise measurements can be conducted more easily and reliably.

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