G - Physics – 01 – R
Patent
G - Physics
01
R
324/58.3, 344/1.
G01R 31/02 (2006.01) H04M 3/30 (2006.01)
Patent
CA 1191553
ABSTRACT OF THE DISCLOSURE The test system locates short circuits and open circuits in a two-lead line with respect to a test device inserted in the line. A first-frequency detector, a second-frequency generator and a predetermined voltage generator are selec- tively connected at a test end of the line in switching fa- cility. The test device comprises one or two circuits for detecting a predetermined in-line current, a circuit for detecting a predetermined in-line voltage, a supply circuit that is energized in response to the detected predetermined current or voltage, a circuit that can detect the second frequency when it is supplied by the supply circuit when energized, and a switching circuit that loops the line across a first-frequency generator in response to the detetion of the second frequency. The detection of the second frequency and the generation of the first frequency mean that a short circuit or an open circuit is situated in the line section between the test device and the load circuit at the other line end.
408761
Gadonna Michel
Kastler Joel
Gadonna Michel
Kastler Joel
Robic Robic & Associes/associates
LandOfFree
Test system for locating short circuits and open circuits in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test system for locating short circuits and open circuits in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test system for locating short circuits and open circuits in... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1258886