G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 27/72 (2006.01) G01N 25/72 (2006.01) G01R 33/035 (2006.01)
Patent
CA 2345126
The present invention relates to a testing device for detecting and determining material inhomogeneities in electrically conductive samples (10), comprising a support (30) for the samples(10) to be tested, a temperature regulating device (30, 50, 60) for configuring a temperature profile in the sample (10), a drive connected to the support (30) for changing the position of the sample (10) and at least one measuring sensor (20) for contactless measurement of the magnetic field outside the sample (10).
L'invention concerne un dispositif d'essai pour détecter et localiser des hétérogénéités de matériau dans des échantillons électroconducteurs (10). Ce dispositif comprend un support (30) pour l'échantillon à tester (10), une unité de réglage de température (30, 50, 60) pour former un profil de température dans l'échantillon (10), un organe d'entraînement raccordé au support (30) pour changer la position de l'échantillon (10) et au moins un transducteur de mesure (20) pour mesurer sans contact le champ magnétique à l'extérieur de l'échantillon (10).
Hinken Johann H.
Tavrin Yury
Borden Ladner Gervais Llp
F.i.t. Messtechnik Gmbh
Hinken Johann H.
Tavrin Yury
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