G - Physics – 06 – T
Patent
G - Physics
06
T
G06T 7/00 (2006.01) A61B 6/03 (2006.01) G06T 15/00 (2006.01) G06T 17/00 (2006.01)
Patent
CA 2473834
Disclosed is a method of analyzing curvilinear structures by receiving (200, 210) three-dimensional space imaging data of a curvilinear structure, defining (220) an axis curve within the curvilinear structure, sweeping (230) a line segment along said axis curve so as to define a ribbon in said three- dimensional space, and adsorbing (240) data from said three-dimensional space onto said ribbon. This ribbon may then be flattened (250) for convenient examination.
L'invention concerne un procédé permettant d'analyser des structures curvilinéaires, qui comprend les étapes consistant: à recevoir (200, 210) des données d'imagerie d'espace tridimensionnel d'une structure curvilinéaire; à définir (220) une courbe d'axe dans ladite structure curvilinéaire; à balayer (230) un segment de ligne le long de ladite courbe d'axe de façon à définir un ruban dans ledit espace tridimensionnel; et à adsorber (240) des données provenant dudit espace tridimensionnel sur ledit ruban. Ledit ruban peut ensuite être aplati (250) pour une analyse commode.
Fetherstonhaugh & Co.
Siemens Corporate Research Inc.
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