G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 23/207 (2006.01)
Patent
CA 2110599
2110599 9308462 PCTABS00021 An X-ray diffractometer has an X-ray source (1) for producing an X-ray beam; a position sensitive detector (3) for detecting diffracted X-rays over a wide angle; and means for effecting controlled relative rotation between the detector and the X-ray source incident beam. A sample holder (5) is capable of rotation about threee mutually perpendicular axis and is also capable (11-13) of providing rotation of the sample (14) relative to the sample holder about two perpendicular axes. Thin films or substrates under investigation can be individually aligned into selected diffraction geometries by such a diffractometer. The X-ray source itself may be rotatable about the axis of the X-ray beam.
Salje Ekhard Karl Hermann
Borden Ladner Gervais Llp
Cambridge Surface Analytics Limited
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