G - Physics – 06 – G
Patent
G - Physics
06
G
G06G 7/56 (2006.01)
Patent
CA 2586680
Different subsets of multiarray resistivity measurements are inverted using a corresponding resistivity model. The models are selected based at least in part on the resolution of the measurements. Results of the inversion are combined to give a single model consistent with the resolution and depth of penetration of each subset of the multiarray data.
Différents sous-ensembles de mesure de résistivité multi-matrice sont inversés au moyen d'un modèle de résistivité correspondant. Les modèles sont sélectionnés au moins en partie sur la base de la résolution des mesures. Les résultats sont combinés pour donner un seul modèle cohérent par rapport à la résolution et la profondeur de pénétration de chaque ensemble des données multi-matrice.
Baker Hughes Incorporated
Cassan Maclean
LandOfFree
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